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  • Reverse engineering Flash EEPROM memories using Scanning Electron Microscopy 

    Courbon, F; Skorobogatov, S; Woods, C
    In this article, a methodology to extract Flash EEPROM memory contents is presented. Samples are first backside prepared to expose the tunnel oxide of floating gate transistors. Then, a Scanning Electron Microscope (SEM) ...
  • Software Prefetching for Indirect Memory Accesses 

    Ainsworth, S; Jones, TM (Association for Computing Machinery, 2017-02-04)
    Many modern data processing and HPC workloads are heavily memory-latency bound. A tempting proposition to solve this is software prefetching, where special non-blocking loads are used to bring data into the cache hierarchy ...
  • On Microarchitectural Mechanisms for Cache Wearout Reduction 

    Valero, Alejandro; Miralaei, Negar; Petit, Salvador; Sahuquillo, Julio; Jones, Timothy M (IEEE, 2016)
    Hot carrier injection (HCI) and bias temperature instability (BTI) are two of the main deleterious effects that increase a transistor's threshold voltage over the lifetime of a microprocessor. This voltage degradation ...
  • Functional Distributional Semantics 

    Emerson, G; Copestake, A (The Association for Computational Linguistics, 2016-08-11)
    Vector space models have become popular in distributional semantics, despite the challenges they face in capturing various semantic phenomena. We propose a novel probabilistic framework which draws on both formal semantics ...

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