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  Dataset - The effect of local reinforcing bar reductions and anchorage zone cracking on the load capacity of RC half-joints 

  Desnerck, Pieter Robert; Lees, Janet Marillyn; Morley, CT
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  Research data supporting "Highly Stable Amorphous Zinc Tin Oxynitride Thin Film Transistors under Positive Bias Stress" 

  Niang, KM; Beyer, BC; Meyer, JC; Flewitt, Andrew John
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  Research data supporting "The Origin of the High Off-State Current in p-Type Cu₂O Thin Film Transistors" 

  Han, Sanggil; Flewitt, Andrew John
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  Supporting Information (SI): Global flows of chemicals: from fossil fuel feedstocks to chemical products 

  Levi, Peter; Cullen, Jonathan Michael

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