Research data supporting "Highly Stable Amorphous Zinc Tin Oxynitride Thin Film Transistors under Positive Bias Stress"
Repository URI
Repository DOI
Change log
Authors
Niang, KM
Beyer, BC
Meyer, JC
Flewitt, AJ
Description
Data for publication in raw form
Version
Software / Usage instructions
Excel
Keywords
Thin film transistors, Zinc oxynitride
Publisher
Sponsorship
Engineering and Physical Sciences Research Council (EP/M013650/1)