Research data supporting "Structural properties of thin-film ferromagnetic topological insulators"
Repository URI
Repository DOI
Type
Dataset
Change log
Authors
Richardson, CL
Devine-Stoneman, JM
Divitini, Giorgio https://orcid.org/0000-0003-2775-610X
Vickers, ME
Chang, CZ
Description
High-resolution X-ray diffractometry and scanning transmission electron microscopy data, taken on thin films of ferromagnetic topological insulators. The aim of the study was to investigate the influence of substrate choice, film thickness and doping on the unit cell parameters, for a range typically used in electronic devices.
Version
Software / Usage instructions
HRXRD data taken using Panalytical's Data Collector software, .xrdml files including headers have been converted to .csv format.
EDX data was denoised using Principal Component Analysis routines integrated in Hyperspy (an open-source toolkit for EM data analysis). The analysed data is presented here in .tif and .csv formats.
Keywords
Topological insulators, Quantum anomalous Hall effect
Publisher
Sponsorship
Leverhulme Trust (RPG-2013-337)