Research data supporting "Structural properties of thin-film ferromagnetic topological insulators"
Description
High-resolution X-ray diffractometry and scanning transmission electron microscopy data, taken on thin films of ferromagnetic topological insulators. The aim of the study was to investigate the influence of substrate choice, film thickness and doping on the unit cell parameters, for a range typically used in electronic devices.
Format
HRXRD data taken using Panalytical's Data Collector software, .xrdml files including headers have been converted to .csv format.
EDX data was denoised using Principal Component Analysis routines integrated in Hyperspy (an open-source toolkit for EM data analysis). The analysed data is presented here in .tif and .csv formats.
Keywords
Topological insulators, Quantum anomalous Hall effect
Relationships
Publication Reference: https://doi.org/10.1038/s41598-017-12237-2
Sponsorship
Leverhulme Trust (RPG-2013-337)
Identifiers
This record's DOI: https://doi.org/10.17863/CAM.10453
Rights
Attribution 4.0 International (CC BY 4.0)
Licence URL: https://creativecommons.org/licenses/by/4.0/
Statistics
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Except where otherwise noted, this item's licence is described as Attribution 4.0 International (CC BY 4.0)