Research data supporting "Structural properties of thin-film ferromagnetic topological insulators"
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Change log
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Description
High-resolution X-ray diffractometry and scanning transmission electron microscopy data, taken on thin films of ferromagnetic topological insulators. The aim of the study was to investigate the influence of substrate choice, film thickness and doping on the unit cell parameters, for a range typically used in electronic devices.
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Software / Usage instructions
HRXRD data taken using Panalytical's Data Collector software, .xrdml files including headers have been converted to .csv format.
EDX data was denoised using Principal Component Analysis routines integrated in Hyperspy (an open-source toolkit for EM data analysis). The analysed data is presented here in .tif and .csv formats.
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Rights and licensing
Except where otherwised noted, this item's license is described as Attribution 4.0 International (CC BY 4.0)
Sponsorship
Leverhulme Trust (RPG-2013-337)