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Research data supporting "Structural properties of thin-film ferromagnetic topological insulators"


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Authors

Richardson, CL 
Devine-Stoneman, JM 
Vickers, ME 
Chang, CZ 

Description

High-resolution X-ray diffractometry and scanning transmission electron microscopy data, taken on thin films of ferromagnetic topological insulators. The aim of the study was to investigate the influence of substrate choice, film thickness and doping on the unit cell parameters, for a range typically used in electronic devices.

Version

Software / Usage instructions

HRXRD data taken using Panalytical's Data Collector software, .xrdml files including headers have been converted to .csv format. EDX data was denoised using Principal Component Analysis routines integrated in Hyperspy (an open-source toolkit for EM data analysis). The analysed data is presented here in .tif and .csv formats.

Keywords

Topological insulators, Quantum anomalous Hall effect

Publisher

Sponsorship
Leverhulme Trust (RPG-2013-337)
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