Charge density determination in semiconductors and other materials by electron diffraction.
Burgess, William George
University of Cambridge
Department of Materials Science and Metallurgy
Doctor of Philosophy (PhD)
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Burgess, W. G. (1995). Charge density determination in semiconductors and other materials by electron diffraction. (Doctoral thesis). https://doi.org/10.17863/CAM.22436
Digitisation of this thesis was sponsored by Arcadia Fund, a charitable fund of Lisbet Rausing and Peter Baldwin.
This record's DOI: https://doi.org/10.17863/CAM.22436
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