Dispersion retrieval from multi-level ultra-deep reactive-ion-etched microstructures for terahertz slow-wave circuits

Baik, Chan-Wook; Young Ahn, Ho; Kim, Yongsung; Lee, Jooho; Hong, Seogwoo; Hee Choi, Jun; Kim, Sunil; Hun Lee, Sang; Yeon Jun, So; Yu, SeGi; Lawrence Ives, R; Min Kim, Jong; Hwang, Sungwoo

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Authors

Baik, Chan-Wook

Young Ahn, Ho

Kim, Yongsung

Lee, Jooho

Hong, Seogwoo

Hee Choi, Jun

Kim, Sunil

Publication Date

2014-01-13

Journal Title

Applied Physics Letters

ISSN

0003-6951

Publisher

AIP Publishing

Volume

104

Issue

Pages

021118-021118

Language

English

Type

Article

This Version

VoR

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Citation

Baik, C., Young Ahn, H., Kim, Y., Lee, J., Hong, S., Hee Choi, J., Kim, S., et al. (2014). Dispersion retrieval from multi-level ultra-deep reactive-ion-etched microstructures for terahertz slow-wave circuits. Applied Physics Letters, 104 (2), 021118-021118. https://doi.org/10.1063/1.4862324

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External DOI: https://doi.org/10.1063/1.4862324

This record's URL: https://www.repository.cam.ac.uk/handle/1810/295125

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