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Stacking fault-associated polarized surface-emitted photoluminescence from zincblende InGaN/GaN quantum wells

Accepted version
Peer-reviewed

Type

Article

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Authors

Abstract

jats:pZincblende InGaN/GaN quantum wells offer a potential improvement to the efficiency of green light emission by removing the strong electric fields present in similar structures. However, a high density of stacking faults may have an impact on the recombination in these systems. In this work, scanning transmission electron microscopy and energy-dispersive x-ray measurements demonstrate that one-dimensional nanostructures form due to indium segregation adjacent to stacking faults. In photoluminescence experiments, these structures emit visible light, which is optically polarized up to 86% at 10 K and up to 75% at room temperature. The emission redshifts and broadens as the well width increases from 2 nm to 8 nm. Photoluminescence excitation measurements indicate that carriers are captured by these structures from the rest of the quantum wells and recombine to emit light polarized along the length of these nanostructures.</jats:p>

Description

Keywords

51 Physical Sciences, 5108 Quantum Physics, 40 Engineering, 4018 Nanotechnology

Journal Title

Applied Physics Letters

Conference Name

Journal ISSN

0003-6951
1077-3118

Volume Title

117

Publisher

AIP Publishing

Rights

All rights reserved
Sponsorship
Engineering and Physical Sciences Research Council (EP/M010589/1)
Engineering and Physical Sciences Research Council (EP/R01146X/1)
EPSRC (via Cardiff University) (513956)
Engineering and Physical Sciences Research Council (EP/N01202X/1)