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Research data supporting "Time-resolved open-circuit conductive atomic force microscopy for direct electromechanical characterisation"


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Authors

Kim, Wonjong 
Vukajlovic-Plestina, Jelena 
Fontcuberta i Morral, Anna 

Description

These files contain the original AFM files and outputs of the experiments described in the paper. As such they were obtained using the Bruker Icon AFM and have either two dimensional scans containing topography and current at different biases when scanning atop nanowires, or current vs. deflection (or height) obtained as the AFM cantilever was driven towards the sample. To be viewed using AFM software or any data software in case of txt files.

Version

Software / Usage instructions

AFM data files, text files

Keywords

AFM

Publisher

Sponsorship
Engineering and Physical Sciences Research Council (EP/G037221/1)
European Research Council (639526)
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