Research data supporting "Time-resolved open-circuit conductive atomic force microscopy for direct electromechanical characterisation"
Repository URI
Repository DOI
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Type
Dataset
Change log
Authors
Calahorra, Yonatan https://orcid.org/0000-0001-9530-1006
Calahorra, Yonatan https://orcid.org/0000-0001-9530-1006
Kim, Wonjong
Vukajlovic-Plestina, Jelena
Fontcuberta i Morral, Anna
Description
These files contain the original AFM files and outputs of the experiments described in the paper. As such they were obtained using the Bruker Icon AFM and have either two dimensional scans containing topography and current at different biases when scanning atop nanowires, or current vs. deflection (or height) obtained as the AFM cantilever was driven towards the sample. To be viewed using AFM software or any data software in case of txt files.
Version
Software / Usage instructions
AFM data files, text files
Keywords
AFM
Publisher
Sponsorship
Engineering and Physical Sciences Research Council (EP/G037221/1)
European Research Council (639526)
European Research Council (639526)