Research data supporting ''The effect of facet lines on critical current density and trapped field in bulk RE-Ba-Cu-O single grains''
View / Open Files
MetadataShow full item record
Shi, Y., Dennes, A., Ainslie, M., Speller, S., Governr, C., Durrell, J., & Cardwell, D. (2022). Research data supporting ''The effect of facet lines on critical current density and trapped field in bulk RE-Ba-Cu-O single grains'' [Dataset]. https://doi.org/10.17863/CAM.84356
Detailed current density measurements and the trapped fields measurements which show the effects of Jc distribution. Figure3 & Figure 4(a,c) (Tc and Jc along a faceline of sample 20181123 F7-1).xlsx are the results of critical transition temperature Tc and M-H loops measured using MPMS in the Maxwell centre. The critical current density Jc is calculated from the M-H loops for each cuboid at 77 K for an applied field cycle of 0 to 7 T to 0 T using the Bean model. All the data of 20 pieces of superconductor bulk samples in figure 1 is in this .xlsx file. The results are shown in figure 3 and 4. All .opj Origin 8.5 files are showing the measurements of trapped fields which are the indicators of samples' quality. We show the readers the shapes and magnitudes of trapped field for discussing ‘’The effect of facet lines on critical current density and trapped field in bulk RE-Ba-Cu-O single grains‘’. Each sample to be measured was field cooled at 77 K in an applied magnetic field of 1.0 T prior to 2D trapped field mapping using a rotating Hall sensor array. Origin was used to record the original data. These files here in .opj recorded the original data and their generated figures.
Excel, Origin 8.5
(RE)BCO, bulk superconductors, facet lines, homogeneity, trapped field, uniformity
Publication Reference: https://doi.org/10.1088/1361-6668/ac883dhttps://www.repository.cam.ac.uk/handle/1810/340039
This record's DOI: https://doi.org/10.17863/CAM.84356
Attribution 4.0 International (CC BY 4.0)
Licence URL: https://creativecommons.org/licenses/by/4.0/