Photoluminescence microscopy of optoelectronic materials

Abstract

Photoluminescence (PL) microscopy is a technique for mapping the spatial distribution of optical and electronic properties in optoelectronic (OE) materials, including silicon, III–V and organic semiconductors, halide perovskites and quantum dots. This Primer provides an overview of the foundational principles and methods of PL microscopy, highlighting how different microscopy configurations can reveal unique insights into the photophysical behaviours of OE materials and the importance of selecting appropriate set-ups for accurate analysis. Key topics include acquisition modes such as widefield and confocal scanning, along with time-resolved and spectrally resolved PL techniques. Practical guidance on experimental set-up, data acquisition and analytical approaches is provided, addressing common challenges and limitations. Finally, emerging applications, solutions to typical issues and potential advancements in PL imaging are discussed, with the goal of supporting the optimization of next-generation OE materials and devices.