High-Throughput Electrical Characterization of Nanomaterials from Room to Cryogenic Temperatures.

Smith, Luke W; Batey, Jack O; Alexander-Webber, Jack A; Fan, Ye; Hsieh, Yu-Chiang; Fung, Shin-Jr; Jevtics, Dimitars; Robertson, Joshua; Guilhabert, Benoit JE; Strain, Michael J; Dawson, Martin D; Hurtado, Antonio; Griffiths, Jonathan P; Beere, Harvey E; Jagadish, Chennupati; Burton, Oliver J; Hofmann, Stephan; Chen, Tse-Ming; Ritchie, David A; Kelly, Michael; Joyce, Hannah J; Smith, Charles G

doi:10.1021/acsnano.0c05622

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