Research data supporting "An approach to simultaneously test multiple devices for high-throughput production of thin-film electronics"
Flewitt, Andrew J.
University of Cambridge
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Kumar, A., & Flewitt, A. J. (2015). Research data supporting "An approach to simultaneously test multiple devices for high-throughput production of thin-film electronics" [Dataset]. https://www.repository.cam.ac.uk/handle/1810/249078
This is data from developing new testing method under AUTOFLEX Project (EP/L505201/1). This includes Thin-Film Transistor device electrical characterization, Ring Oscillator circuit electrical characterization and circuit simulation.
MicroSoft Excel Workbook
Thin film transistors, Semiconductor device testing, Printed Electronics
Publication Reference: https://doi.org/10.1109/JDT.2015.2462291
This work was supported by the EPSRC [grant numbers EP/L505201/1, EP/K03099X/1] and Innovate UK.
This record's URL: https://www.repository.cam.ac.uk/handle/1810/249078
Attribution-ShareAlike 2.0 UK: England & Wales
Licence URL: http://creativecommons.org/licenses/by-sa/2.0/uk/
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