Research data supporting "An approach to simultaneously test multiple devices for high-throughput production of thin-film electronics"
Repository URI
Repository DOI
Change log
Authors
Kumar, Abhishek
Flewitt, Andrew J.
Description
This is data from developing new testing method under AUTOFLEX Project (EP/L505201/1). This includes Thin-Film Transistor device electrical characterization, Ring Oscillator circuit electrical characterization and circuit simulation.
Version
Software / Usage instructions
MicroSoft Excel Workbook
Keywords
Thin film transistors, Semiconductor device testing, Printed Electronics
Publisher
University of Cambridge
Sponsorship
This work was supported by the EPSRC [grant numbers EP/L505201/1, EP/K03099X/1] and Innovate UK.