Research data supporting “Spectroscopic ellipsometry characterization of ZnO:Sn thin films with various Sn composition deposited by remote-plasma reactive sputtering”
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Description
Data generated in the characterization and analysis of the Zinc Tin Oxide thin films (as shown in the Figures in the manuscript)
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microsoft office
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University of Cambridge
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Except where otherwised noted, this item's license is described as Attribution 4.0 International
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EPSRC [EP/M013650/1]