Validity of Vegard’s rule for Al$_{1−x}$In$_x$N (0.08 < $x$ < 0.28) thin films grown on GaN templates
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Peer-reviewed
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In this work, comparative x-ray diffraction (XRD) and Rutherford backscattering spectrometry (RBS) measurements allow a comprehensive characterization of Al
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1361-6463
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Engineering and Physical Sciences Research Council (EP/M010589/1)