Data to accompany "The effect of the dielectric end groups on the positive bias stress stability of N2200 organic field effect transistors" by D. Simatos et al., APL Materials 9, 041113 (2021); https://doi.org/10.1063/5.0044785 also available on Apollo (https://www.repository.cam.ac.uk/handle/1810/319841) and arXiv (https://arxiv.org/abs/2104.07089).

The zip folder contains raw datasets (.txt and .csv files) of transfer and output curves as well as of positive bias stress (PBS) of OFETs (Organic Field Effect Transistors) fabricated with the semiconducting organic polymers indacenodithiophene-co-benzothiadiazole (C16-IDTBT) and poly[2,5-bis(3-tetradecylthiophen-2-yl)thieno[3,2-b]thiophene] (C14-PBTTT) as well as Cytop-M (CTL-809M) and Cytop-S (CTX809-SP2) gate dielectrics (AGC Inc.). The analysis (.opju file) was carried out in Origin (the data analysis and graphing software from OriginLab). Dielectric thicknesses measured with a profilometer are also included. See the main manuscript for more details.

Folder names include information relating to the batch & date of device fabrication, contact geometry (TGBC - top gate bottom contact), type of polymer (IDTBT, N2200), type of dielectric (Cytop-M, Cytop-S), fabrication and testing conditions (nitrogen atmosphere, air exposure or vacuum) and the number of days elapsed since fabrication. In addition, Cryo denotes measurements as a function of temperature and PBS - Positive Bias Stress results.

Filenames include information relating to the fabrication batch, contact geometry (TGBC - top gate bottom contact), type of polymer (IDTBT, N2200), type of dielectric (Cytop-M, Cytop-S), fabrication and testing conditions (nitrogen atmosphere, air exposure and vacuum) as well as the number of days elapsed since fabrication, T- transfer curve, O- output curve. PBS filenames also include the time elapsed from the beginning of an experiment and Cryo filenames include the temperature in Kelvin.