Avalanche dynamics of dislocations and cracks under tension in additively manufactured copper

Abstract

Acoustic emission, AE, spectroscopy identifies dislocation avalanches and crack propagation in high-purity Cu with self-stabilized dislocation networks. These samples were produced by additive manufacturing where thermal gradients form cellular structures. These structures confine avalanches of dislocation movements (∼confined dislocations) with an energy exponent ε = 1.82 ± 0.04. Free dislocation movement follows force-integrated mean-field behavior with ε = 1.6 ± 0.02. Additional crack propagation under tension exhibits a critical failure exponent of ε = 1.45 ± 0.01. These three mechanisms combine to generate sample failure under tension. We use this example to demonstrate how different avalanche mechanisms can be disentangled in AE spectroscopy of additive manufactured metal and how the specific self-stabilized dislocation networks influence these avalanche dynamics.