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In situ intercalation dynamics in inorganic-organic layered perovskite thin films.


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Abstract

The properties of layered inorganic semiconductors can be manipulated by the insertion of foreign molecular species via a process known as intercalation. In the present study, we investigate the phenomenon of organic moiety (R-NH3I) intercalation in layered metal-halide (PbI2)-based inorganic semiconductors, leading to the formation of inorganic-organic (IO) perovskites [(R-NH3)2PbI4]. During this intercalation strong resonant exciton optical transitions are created, enabling study of the dynamics of this process. Simultaneous in situ photoluminescence (PL) and transmission measurements are used to track the structural and exciton evolution. On the basis of the experimental observations, a model is proposed which explains the process of IO perovskite formation during intercalation of the organic moiety through the inorganic semiconductor layers. The interplay between precursor film thickness and organic solution concentration/solvent highlights the role of van der Waals interactions between the layers, as well as the need for maintaining stoichiometry during intercalation. Nucleation and growth occurring during intercalation matches a Johnson-Mehl-Avrami-Kolmogorov model, with results fitting both ideal and nonideal cases.

Description

Journal Title

ACS Appl Mater Interfaces

Conference Name

Journal ISSN

1944-8244
1944-8252

Volume Title

Publisher

American Chemical Society (ACS)

Rights and licensing

Except where otherwised noted, this item's license is described as DSpace@Cambridge License
Sponsorship
Engineering and Physical Sciences Research Council (EP/G060649/1)
European Research Council (320503)
This work is part of High-Impact Research scheme of IIT Delhi, Nano Research Facility (MCIT, Govt. Of India), UK-India Education and Research Initiative (UKIERI) programme, and part funded by EPSRC grant EP/G060649/1, and ERC LINASS 320503.