Scanning Kelvin Probe Microscopy Investigation of the Role of Minority Carriers on the Switching Characteristics of Organic Field-Effect Transistors
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Hu, Y., Pecunia, V., Jiang, L., Di, C., Gao, X., & Sirringhaus, H. (2016). Scanning Kelvin Probe Microscopy Investigation of the Role of Minority Carriers on the Switching Characteristics of Organic Field-Effect Transistors. Advanced Materials https://www.repository.cam.ac.uk/handle/1810/254074
We have developed a Scanning Kelvin Probe Microscopy (SKPM) based method to probe the effects of low-mobility minority carriers on the switching characteristics of organic field effect transistors (OFETs). By measuring and modeling the transient potential changes in the OFET channel after an applied gate bias pulse, we can extract the low mobility of the minority carriers and understand how these carriers play a key role in the device operation, in particular, in the screening of the gate potential in the OFF state of the transistor and in the recombination of majority carriers trapped in the channel after an ON state stress.
This work was supported by the Engineering and Physical Sciences Research Council (EPSRC) Centre for Innovative Manufacturing in Large-Area Electronics(EP/K03099X/1). Y. Hu thanks the Cambridge Overseas Trust and Chinese Scholarship Council for a postgraduate award. We thank Robin Lamboll and Dr. Abhishek Kumar for helpful discussions about the modeling work.
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