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Research data supporting ‘High-Throughput Electrical Characterisation of Nanomaterials From Room to Cryogenic Temperatures’

Repository URI

https://www.repository.cam.ac.uk/handle/1810/311600

Repository DOI

https://doi.org/10.17863/CAM.58559
Thumbnail Image

Files

Data Repository.zip (2.77 MB)

Type

Dataset

Change log

Authors

Smith, Luke  ORCID logo  https://orcid.org/0000-0003-2194-4708
Fan, Ye  ORCID logo  https://orcid.org/0000-0003-0998-5881

Description

Measurements are performed using electrical methods described in the paper. Data to generate all plots in the associated publication are contained within the zipped file as separate ‘.txt’ files. The README.txt file contains information about each separate file.

Version

Software / Usage instructions

These data files can be opened using any text editor.

Keywords

Nanoelectronic device arrays, Scalable fabrication, High-throughput testing, Graphene and 2D materials, Nanowires, Electronic characterisation

Publisher

Rights and licensing

Attribution 4.0 International (CC BY 4.0)
Except where otherwised noted, this item's license is described as Attribution 4.0 International (CC BY 4.0)
Sponsorship
Engineering and Physical Sciences Research Council (EP/R029075/1)
Engineering and Physical Sciences Research Council (EP/P005152/1)
Engineering and Physical Sciences Research Council (EP/M508007/1)
Engineering and Physical Sciences Research Council (EP/R03480X/1)

Relationships

Supplements:
https://www.repository.cam.ac.uk/handle/1810/311451
https://doi.org/10.1021/acsnano.0c05622

Collections

Research Data - Physics