Raw VSM data used to generate the figures of the paper entitled "Systematic layer-by-layer characterization of multilayers for three-dimensional data storage and logic", as well as the figures in the supplementary material file. The data is presented in 2 columns, column 1 is the applied field in Oe, column 2 is the magnetization (reduced units). For Figure S1, the third column is the derivative of col 2 with respect to the applied field (col 1).

This research data supports “Systematic layer-by-layer characterization of multilayers for three-dimensional data storage and logic” which has been published in “Nanotechnology”.